Class Statistics
What are Wide-Bandgap Oxide Semiconductors?
Wide-bandgap oxide semiconductors represent a transformative class of materials characterized by exceptionally large energy gaps between their valence and conduction bands. Unlike traditional semiconductors, these oxides possess the intrinsic ability to withstand significantly higher electric fields before experiencing dielectric breakdown. This unique physical property allows for the development of power electronics that can operate at much higher voltages and temperatures than conventional silicon or even standard wide-bandgap materials like silicon carbide and gallium nitride. The chemistry of these materials typically involves metal cations bonded with oxygen, forming stable, robust crystalline lattices. Beta-gallium oxide is the most prominent member of this family, garnering intense interest due to its ability to be grown as large-area native substrates directly from the melt. This growth method is a significant advantage, as it mirrors the cost-effective production techniques used for silicon, potentially lowering the barrier to mass-market adoption. Beyond power switching, these oxides are being explored for deep-ultraviolet optoelectronics and radiation-hardened sensors. Because they can handle extreme power densities, they are essential for the next generation of energy-efficient power grids, electric vehicle drivetrains, and high-frequency communication systems. By pushing the limits of electronic performance, wide-bandgap oxides are positioning themselves as the foundational materials for future high-power, high-efficiency electronic architectures that require superior thermal stability and electrical resilience.
Top Wide-Bandgap Oxide Semiconductors
Ranked by data richness — literature synthesis coverage, multi-source DFT corroboration, and patent activity.
| Formula | Band Gap | Best EAH (eV/atom) | Stability | DFT Sources | Recipes |
|---|---|---|---|---|---|
| ZnO | 0.14–1.25 eV | 0.0000 | Stable | 1 | 71 |
| OZn | 0.45–1.28 eV | 0.0000 | On hull (stable) | — | 71 |
| O2Zn2 | 1.80–1.86 eV | — | Not assessed | — | 71 |
| O1Zn1 | 1.68–2.14 eV | — | Not assessed | — | 71 |
| In2O3 | 0.11–5.45 eV | 0.0000 | Stable | 1 | 12 |
| O3Zn3 | Metallic / not reported | — | Not assessed | — | 71 |
| O6Zn6 | Metallic / not reported | — | Not assessed | — | 71 |
| O4Zn4 | Metallic / not reported | — | Not assessed | — | 71 |
| O8Zn8 | Metallic / not reported | — | Not assessed | — | 71 |
| O96Zn96 | Metallic / not reported | — | Not assessed | — | 71 |
| O5Zn5 | Metallic / not reported | — | Not assessed | — | 71 |
| SnO2 | 0.07–2.38 eV | 0.0000 | Stable | 1 | 9 |
| O2Sn | 0.32–2.00 eV | 0.0000 | On hull (stable) | — | 9 |
| In16O24 | 1.12 eV | — | Not assessed | — | 12 |
| In8O12 | 0.22–0.96 eV | — | Not assessed | — | 12 |
| In4O6 | 1.17 eV | — | Not assessed | — | 12 |
| In12O18 | 1.16 eV | — | Not assessed | — | 12 |
| Ga2O3 | 0.47–2.88 eV | 0.0000 | Stable | 1 | 4 |
| O4Sn2 | 0.03–0.38 eV | — | Not assessed | — | 9 |
| O8Sn4 | 0.13–0.37 eV | — | Not assessed | — | 9 |
| O16Sn8 | 0.25 eV | — | Not assessed | — | 9 |
| O24Sn12 | 0.32 eV | — | Not assessed | — | 9 |
| O2Sn1 | Metallic / not reported | — | Not assessed | — | 9 |
| O6Sn3 | Metallic / not reported | — | Not assessed | — | 9 |
| SnO | 0.21–1.92 eV | 0.0000 | Stable | 1 | 0 |
| GaO2 | 2.95 eV | 0.2046 | Unstable | 1 | 0 |
| InO2 | 0.07–0.15 eV | 0.2302 | Unstable | 1 | 0 |
| GaO | 1.31–1.67 eV | 0.0000 | Unstable | 1 | 0 |
| InO | 0.40–0.80 eV | 0.0000 | On hull (stable) | — | 0 |
| Ga2O | 0.68 eV | 0.3095 | Unstable | 1 | 0 |
| ZnO2 | 2.38 eV | 0.0896 | Unstable | 1 | 0 |
| Ga4O6 | 1.37–2.65 eV | — | Not assessed | — | 4 |
| GaO3 | 1.35 eV | 0.2994 | Above hull | — | 0 |
| OSn | 0.41–1.34 eV | 0.0000 | On hull (stable) | — | 0 |
| In2O | 0.41 eV | 0.2388 | Above hull | — | 0 |
| Sn2O3 | 0.67–2.18 eV | 0.0395 | Metastable | — | 0 |
| SnO3 | 0.70–1.75 eV | 0.3096 | Above hull | — | 0 |
| Zn2O | 0.96 eV | 0.7407 | Above hull | — | 0 |
| Sn3O4 | 0.58 eV | 0.1023 | Above hull | — | 0 |
| Sn5O6 | 1.99 eV | 0.0180 | Stable | 1 | 0 |
| SnO7 | 0.63 eV | 0.3403 | Unstable | 1 | 0 |
| O2Zn | 1.28–2.16 eV | 0.1355 | Above hull | — | 0 |
| Ga64O96 | Metallic / not reported | — | Not assessed | — | 4 |
| O4Sn3 | 0.93 eV | 0.2568 | Above hull | — | 0 |
| Ga4O5 | 0.35–0.68 eV | 0.3751 | Above hull | — | 0 |
| Sn4O11 | 0.85–1.79 eV | 0.2549 | Above hull | — | 0 |
| Ga4O11 | 2.05 eV | 0.3655 | Above hull | — | 0 |
| In4O5 | 0.21 eV | 0.2609 | Above hull | — | 0 |
| O6Sn5 | 1.77 eV | 0.0000 | On hull (stable) | — | 0 |
| O7Sn5 | 0.37 eV | 0.2521 | Above hull | — | 0 |
Frequently Asked Questions
How many wide-bandgap oxide semiconductors are in the database?
191 wide-bandgap oxide semiconductors are tracked, of which 0 have multi-source DFT validation and 27 have documented synthesis routes.
What is the most data-rich wide-bandgap oxide semiconductor?
Which wide-bandgap oxide semiconductor has the widest band gap?
Why are wide-bandgap oxides considered superior to silicon for power electronics?
What makes beta-gallium oxide particularly attractive for commercial manufacturing?
Are there limitations to using these materials in electronic devices?
In what specific applications are these oxides expected to have the most impact?
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