SiN

SiN has a DFT band gap of Metallic / not reported across 251 reported structures in 29 space groups; its reference structure is tetragonal (P4/nmm (No. 129)). Cross-validated across 3 computational databases.

At a glance

Key Properties

Cross-validated computational properties for SiN, aggregated across 3 databases.

Band Gap

Metallic / not reported

Energy Above Hull

0.641 eV/atom
Best (lowest) across sources

Stability

Unstable
2 DFT sources

Structures

251
3 databases, 29 space groups
Validation

Cross-Source DFT Agreement

How well independent DFT databases agree on the thermodynamics of SiN. Tight agreement means computed properties can be trusted without re-running calculations.

Agreement Score

0.00 / 1.00
Trust tier: low

Hull Spread

0.531 eV
EAH spread across sources

Sources Compared

2
jarvis, oqmd

Space Group Consensus

—
Crystallography

Reported Structures

Lowest-energy structures reported for SiN, ranked by energy above hull.

Space GroupCrystal SystemBand Gap (eV)E above hull (eV/atom)E/atom (eV)Density (g/cm³)
——0.000.6407-0.422—
——0.001.0410-0.022—
P4/nmm (No. 129)tetragonal0.001.17180.128—
——0.001.39840.336—
——0.001.40970.347—
——0.001.43070.368—
——0.002.15621.094—
——0.002.22831.166—
P1 (No. 1)triclinic———2.81
P1 (No. 1)triclinic———3.08
P1 (No. 1)triclinic———2.85
P1 (No. 1)triclinic———6.84
Intellectual Property

Patent Landscape

20 patents reference SiN or close compositional variants.

PatentTitleAssigneeGranted
10741386Deposition of SiN——
11133181Formation of SiN thin films——
10580645Plasma enhanced atomic layer deposition (PEALD) of SiN using silicon-hydrohalide precursors——
11784043Formation of SiN thin films——
10410857Formation of SiN thin films——
8999847a-Si seasoning effect to improve SiN run-to-run uniformity——
11367613Deposition of SiN——
7271110High density plasma and bias RF power process to make stable FSG with less free F and SiN with less H to enhan——
12344933SiN film embedding method——
11289327Si precursors for deposition of SiN at low temperatures——
Reference

Frequently Asked Questions

Common questions about SiN, answered from cross-validated data.

What is the band gap of SiN?

The reported DFT structures of SiN show no band gap. Standard DFT often misses gaps (especially in transition-metal oxides), so this is not proof the real material is a metal.

More questions
Is SiN a metal, semiconductor, or insulator?
DFT calculations predict no band gap. Standard DFT can miss gaps, so measurements are needed to confirm metallic behavior.
Is SiN thermodynamically stable?
SiN has a lowest energy above hull of 0.641 eV/atom (unstable).
What is the crystal structure of SiN?
The reference structure of SiN is tetragonal symmetry, space group P4/nmm (No. 129).
How many polymorphs of SiN are known?
251 structures of SiN are reported across 3 databases, spanning 29 distinct space groups.
What elements does SiN contain?
SiN contains N and Si (2 elements).
Where does the data for SiN come from?
SiN data is cross-referenced from oqmd, jarvis, mpaloe.
Explore

Related Compounds

Other Silicon Anode Materials in the database.

Data sources & attribution
  • oqmd — Data from the OQMD (oqmd.org). Cite: Saal et al., JOM 65, 1501 (2013); Kirklin et al., npj Comp. Mater. 1, 15010 (2015). (CC-BY-4.0)
  • jarvis — Data from JARVIS (jarvis.nist.gov), NIST. Cite: Choudhary et al., npj Comp. Mater. 6, 173 (2020). (LicenseRef-US-Gov-PD)
  • mpaloe — Data from MP-ALOE. Cite: Kuner et al., npj Comput. Mater. (2025), doi:10.1038/s41524-025-01834-9.

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