InOF

InOF is a stable semiconducting indium oxyfluoride utilized in the study of transparent conducting materials.

Crystal structure of InOF (orthorhombic, Fddd (No. 70))
Ground-state structure · Materials Project
Overview

About InOF

InOF is a thermodynamically stable inorganic compound that functions as a semiconductor. As a member of the transparent conducting oxide class, it represents a unique intersection of oxide and fluoride chemistry, offering distinct electronic properties that are valuable for optoelectronic research.

This material is recognized for its structural stability, sitting directly on the convex hull. Its presence in multiple databases highlights its significance as a subject of study for those looking to expand the library of functional transparent materials beyond traditional binary oxides.

At a glance

Key Properties

Cross-validated computational properties for InOF, aggregated across 3 databases.

Band Gap

0.32–1.83 eV
Range across DFT structures · ground state: wide gap

Energy Above Hull

0.000 eV/atom
Best (lowest) across sources

Stability

Stable
3 DFT sources

Structures

15
3 databases, 5 space groups
Validation

Cross-Source DFT Agreement

How well independent DFT databases agree on the thermodynamics of InOF. Tight agreement means computed properties can be trusted without re-running calculations.

Agreement Score

1.00 / 1.00
Trust tier: high

Hull Spread

0.000 eV
EAH spread across sources

Sources Compared

3
jarvis, materials_project, oqmd

Space Group Consensus

All match
Crystallography

Reported Structures

Lowest-energy structures reported for InOF, ranked by energy above hull.

Space GroupCrystal SystemBand Gap (eV)E above hull (eV/atom)E/atom (eV)Density (g/cm³)
——1.830.0000-2.284—
Fddd (No. 70)orthorhombic1.540.0000-2.139—
Fddd (No. 70)orthorhombic1.330.0000-5.5836.55
——1.620.0128-2.271—
P1 (No. 1)triclinic1.430.0148-5.5686.29
——1.510.0336-2.251—
Pmmn (No. 59)orthorhombic1.380.0465-2.092—
——1.790.0585-2.226—
——1.670.0607-2.223—
——1.690.0808-2.203—
——1.610.0909-2.193—
——0.520.1361-2.148—
Uses

Applications

Where InOF is used.

Transparent electronics researchOptoelectronic device developmentSemiconductor material science
Reference

Frequently Asked Questions

Common questions about InOF, answered from cross-validated data.

What is InOF?

InOF is a stable semiconducting indium oxyfluoride utilized in the study of transparent conducting materials.

More questions
What is InOF used for?
InOF is used in transparent electronics research, optoelectronic device development, and semiconductor material science.
What is the band gap of InOF?
InOF has a DFT-computed band gap of 0.32–1.83 eV across 15 reported structures. Standard DFT underestimates band gaps, so the measured gap is typically larger.
Is InOF a metal, semiconductor, or insulator?
DFT predicts a band gap of up to 1.83 eV (a semiconductor). Measured gaps are typically larger.
Is InOF thermodynamically stable?
Yes — InOF sits on the convex hull (energy above hull 0 eV/atom), i.e. stable.
What is the crystal structure of InOF?
The reference structure of InOF is orthorhombic symmetry, space group Fddd (No. 70).
How many polymorphs of InOF are known?
15 structures of InOF are reported across 3 databases, spanning 5 distinct space groups.
What elements does InOF contain?
InOF contains F, In, and O (3 elements).
Where does the data for InOF come from?
InOF data is cross-referenced from oqmd, jarvis, materials_project, mpaloe, cod.
Comparison

How It Compares

Within the transparent conducting oxides class.

Compared to well-established transparent conducting oxides like ZnO and BaSnO3, InOF offers a different chemical composition by incorporating fluorine into the indium-oxygen framework. While materials like ZnGa2O4 or CaIn2O4 are frequently studied for their specific optical transparency, InOF serves as a specialized alternative that leverages the electronegativity of fluorine to tune the electronic environment of the indium-based lattice.

Explore

Related Compounds

Other Transparent Conducting Oxides in the database.

Data sources & attribution
  • oqmd — Data from the OQMD (oqmd.org). Cite: Saal et al., JOM 65, 1501 (2013); Kirklin et al., npj Comp. Mater. 1, 15010 (2015). (CC-BY-4.0)
  • jarvis — Data from JARVIS (jarvis.nist.gov), NIST. Cite: Choudhary et al., npj Comp. Mater. 6, 173 (2020). (LicenseRef-US-Gov-PD)
  • materials_project — Data from the Materials Project (materialsproject.org). Cite: Jain et al., APL Materials 1, 011002 (2013). (CC-BY-4.0)
  • mpaloe — Data from MP-ALOE. Cite: Kuner et al., npj Comput. Mater. (2025), doi:10.1038/s41524-025-01834-9.
  • cod — Data from the Crystallography Open Database (crystallography.net/cod/). Cite: Grazulis et al., J. Appl. Cryst. 42, 726 (2009). (CC0-1.0)

Analyze InOF in the Lattice Graph platform

Polymorph comparison, confidence scoring, supply-chain risk, and patent monitoring — across 85 source databases.

Explore the Platform →
Results are informational and should be validated by qualified professionals. See Terms of Service