VOF

VOF is a thermodynamically stable semiconducting inorganic compound known for its diverse structural arrangements.

FOV
Crystal structure of VOF (monoclinic, P21 (No. 4))
Ground-state structure · Materials Project
Overview

About VOF

VOF is a distinct inorganic compound characterized by its semiconducting electronic nature. As a thermodynamically stable phase residing on the convex hull, it represents a robust structural configuration within its chemical system.

With a significant number of reported structures across major databases, this material is a focal point for researchers investigating vanadium-based oxyfluorides. Its stability suggests potential for integration into functional electronic or electrochemical devices where reliable material performance is required.

At a glance

Key Properties

Cross-validated computational properties for VOF, aggregated across 3 databases.

Band Gap

0.01–2.64 eV
Range across DFT structures · ground state: narrow gap

Energy Above Hull

0.000 eV/atom
Best (lowest) across sources

Stability

Stable
3 DFT sources

Structures

121
3 databases, 19 space groups
Validation

Cross-Source DFT Agreement

How well independent DFT databases agree on the thermodynamics of VOF. Tight agreement means computed properties can be trusted without re-running calculations.

Agreement Score

1.00 / 1.00
Trust tier: high

Hull Spread

0.000 eV
EAH spread across sources

Sources Compared

3
jarvis, materials_project, oqmd

Space Group Consensus

Mixed (most: P21 (No. 4))
Crystallography

Reported Structures

Lowest-energy structures reported for VOF, ranked by energy above hull.

Space GroupCrystal SystemBand Gap (eV)E above hull (eV/atom)E/atom (eV)Density (g/cm³)
——1.530.0000-2.967—
P21 (No. 4)monoclinic1.360.0000-8.1684.35
P21/c (No. 14)monoclinic0.000.0000-2.721—
Pmn21 (No. 31)orthorhombic1.130.0008-8.1674.35
Ama2 (No. 40)orthorhombic1.260.0038-8.1644.34
P41212 (No. 92)tetragonal0.000.0075-8.1604.34
Pmn21 (No. 31)orthorhombic0.000.0080-2.713—
P21/c (No. 14)monoclinic0.000.0094-2.712—
P21/c (No. 14)monoclinic0.000.0138-8.1544.70
Cm (No. 8)monoclinic0.000.0142-2.707—
C2 (No. 5)monoclinic0.000.0143-2.707—
Pmn21 (No. 31)orthorhombic0.000.0175-2.704—
Uses

Applications

Where VOF is used.

Materials science researchSolid-state electronic device developmentVanadium-based chemical synthesis
Reference

Frequently Asked Questions

Common questions about VOF, answered from cross-validated data.

What is VOF?

VOF is a thermodynamically stable semiconducting inorganic compound known for its diverse structural arrangements.

More questions
What is VOF used for?
VOF is used in materials science research, solid-state electronic device development, and vanadium-based chemical synthesis.
What is the band gap of VOF?
VOF has a DFT-computed band gap of 0.01–2.64 eV across 121 reported structures. Standard DFT underestimates band gaps, so the measured gap is typically larger.
Is VOF a metal, semiconductor, or insulator?
DFT predicts a band gap of up to 2.64 eV (a semiconductor). Measured gaps are typically larger.
Is VOF thermodynamically stable?
Yes — VOF sits on the convex hull (energy above hull 0 eV/atom), i.e. stable.
What is the crystal structure of VOF?
The reference structure of VOF is monoclinic symmetry, space group P21 (No. 4).
What is the density of VOF?
The computed density of the ground-state structure of VOF is 4.35 g/cm³.
How many polymorphs of VOF are known?
121 structures of VOF are reported across 3 databases, spanning 19 distinct space groups.
What elements does VOF contain?
VOF contains F, O, and V (3 elements).
Where does the data for VOF come from?
VOF data is cross-referenced from oqmd, materials_project, jarvis.
Comparison

How It Compares

As a unique inorganic compound, VOF serves as a foundational reference point for understanding the interplay between vanadium, oxygen, and fluorine in solid-state chemistry. Its position on the convex hull establishes it as a baseline for structural stability in this chemical family.

Data sources & attribution
  • oqmd — Data from the OQMD (oqmd.org). Cite: Saal et al., JOM 65, 1501 (2013); Kirklin et al., npj Comp. Mater. 1, 15010 (2015). (CC-BY-4.0)
  • materials_project — Data from the Materials Project (materialsproject.org). Cite: Jain et al., APL Materials 1, 011002 (2013). (CC-BY-4.0)
  • jarvis — Data from JARVIS (jarvis.nist.gov), NIST. Cite: Choudhary et al., npj Comp. Mater. 6, 173 (2020). (LicenseRef-US-Gov-PD)

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