TiW

TiW is a metallic titanium-tungsten alloy frequently used as a diffusion barrier in semiconductor manufacturing.

TiW
Crystal structure of TiW
Ground-state structure · Materials Project
Overview

About TiW

TiW is a metallic binary alloy composed of titanium and tungsten. It is recognized for its robust structural integrity and is considered highly synthesizable due to its position near the thermodynamic hull, making it a reliable candidate for material engineering tasks. Its metallic nature ensures high electrical conductivity, which is critical for its performance in demanding technical environments. The compound is widely utilized in the semiconductor industry, particularly as a diffusion barrier layer that prevents the intermixing of metals in integrated circuits. Its ability to maintain stability under various processing conditions makes it a staple in microelectronics manufacturing.

At a glance

Key Properties

Cross-validated computational properties for TiW, aggregated across 5 databases.

Band Gap

Metallic / not reported

Energy Above Hull

0.000 eV/atom
Best (lowest) across sources

Stability

Stable
3 DFT sources

Structures

299
5 databases, 30 space groups
Validation

Cross-Source DFT Agreement

How well independent DFT databases agree on the thermodynamics of TiW. Tight agreement means computed properties can be trusted without re-running calculations.

Agreement Score

0.02 / 1.00
Trust tier: low

Hull Spread

0.245 eV
EAH spread across sources

Sources Compared

3
jarvis, materials_project, oqmd

Space Group Consensus

All match
Crystallography

Reported Structures

Lowest-energy structures reported for TiW, ranked by energy above hull.

Space GroupCrystal SystemBand Gap (eV)E above hull (eV/atom)E/atom (eV)Density (g/cm³)
——0.000.0000-0.070—
——0.000.0027-0.068—
——0.000.0058-0.065—
——0.000.0135-0.057—
——0.000.0154-0.055—
Cmmm (No. 65)orthorhombic0.000.0225-32.13011.98
——0.000.0254-0.045—
——0.000.0284-0.042—
——0.000.0288-0.042—
——0.000.0293-0.041—
——0.000.0301-0.040—
——0.000.0370-0.033—
Uses

Applications

Where TiW is used.

Diffusion barriers in integrated circuitsAdhesion promotion in thin-film metallizationMicroelectronic contact layers
Intellectual Property

Patent Landscape

5 patents reference TiW or close compositional variants.

PatentTitleAssigneeGranted
6855638Process to pattern thick TiW metal layers using uniform and selective etching——
8025812Selective etch of TiW for capture pad formation——
5290588TiW barrier metal process——
5462638Selective etching of TiW for C4 fabrication——
4787958Method of chemically etching TiW and/or TiWN——
Reference

Frequently Asked Questions

Common questions about TiW, answered from cross-validated data.

What is TiW?

TiW is a metallic titanium-tungsten alloy frequently used as a diffusion barrier in semiconductor manufacturing.

More questions
What is TiW used for?
TiW is used in diffusion barriers in integrated circuits, adhesion promotion in thin-film metallization, and microelectronic contact layers.
What is the band gap of TiW?
The reported DFT structures of TiW show no band gap. Standard DFT often misses gaps (especially in transition-metal oxides), so this is not proof the real material is a metal.
Is TiW a metal, semiconductor, or insulator?
DFT calculations predict no band gap. Standard DFT can miss gaps, so measurements are needed to confirm metallic behavior.
Is TiW thermodynamically stable?
Yes — TiW sits on the convex hull (energy above hull 0 eV/atom), i.e. stable.
How many polymorphs of TiW are known?
299 structures of TiW are reported across 5 databases, spanning 30 distinct space groups.
What elements does TiW contain?
TiW contains Ti and W (2 elements).
Where does the data for TiW come from?
TiW data is cross-referenced from oqmd, materials_project.
Comparison

How It Compares

As a binary alloy, TiW serves as a foundational material in its class, often favored for its specific balance of mechanical hardness and chemical resistance. It acts as a critical interface material, providing superior adhesion and barrier properties that are essential for the reliability of modern electronic devices.

Data sources & attribution
  • oqmd — Data from the OQMD (oqmd.org). Cite: Saal et al., JOM 65, 1501 (2013); Kirklin et al., npj Comp. Mater. 1, 15010 (2015). (CC-BY-4.0)
  • materials_project — Data from the Materials Project (materialsproject.org). Cite: Jain et al., APL Materials 1, 011002 (2013). (CC-BY-4.0)

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Polymorph comparison, confidence scoring, supply-chain risk, and patent monitoring — across 85 source databases.

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