FLaO

Lanthanum oxyfluoride · LaOF

Lanthanum oxyfluoride is a stable, insulating compound used in advanced materials research for its unique optical and dielectric properties.

FLaO
Crystal structure of FLaO (tetragonal, P4/nmm (No. 129))
Ground-state structure · Materials Project
Overview

About Lanthanum oxyfluoride

Lanthanum oxyfluoride is a stable inorganic compound composed of lanthanum, oxygen, and fluorine. As a wide-band-gap insulator, it exhibits robust electronic properties that make it a subject of interest for specialized optical and dielectric applications. Its position on the convex hull confirms its thermodynamic stability, ensuring structural integrity under standard conditions.

This material is frequently studied for its potential in high-performance ceramics and as a precursor in the synthesis of complex lanthanum-based functional materials. Its unique combination of anionic species allows for versatile chemical tuning, which is essential for developing next-generation electronic components and insulating coatings.

At a glance

Key Properties

Cross-validated computational properties for Lanthanum oxyfluoride, aggregated across 3 databases.

Band Gap

4.22–4.75 eV
Range across DFT structures · ground state: insulator

Energy Above Hull

0.000 eV/atom
Best (lowest) across sources

Stability

Stable
2 DFT sources

Structures

10
3 databases, 5 space groups
Validation

Cross-Source DFT Agreement

How well independent DFT databases agree on the thermodynamics of FLaO. Tight agreement means computed properties can be trusted without re-running calculations.

Only 1 independent DFT source (materials_project) reports a hull energy for FLaO, so cross-source agreement can't be assessed yet.

Crystallography

Reported Structures

Lowest-energy structures reported for FLaO, ranked by energy above hull.

Space GroupCrystal SystemBand Gap (eV)E above hull (eV/atom)E/atom (eV)Density (g/cm³)
R-3m (No. 166)trigonal4.220.0000-8.1896.07
P4/nmm (No. 129)tetragonal4.570.0001-8.1896.00
F-43m (No. 216)cubic4.750.0612-8.1286.02
P4/nmm (No. 129)tetragonal———5.94
P4/nmm (No. 129)tetragonal———5.90
R-3m (No. 166)trigonal———6.03
P3m1 (No. 156)trigonal———4.63
Fm-3m (No. 225)cubic———6.06
P4/nmm (No. 129)tetragonal———6.67
R-3m (No. 166)trigonal———6.02
Uses

Applications

Where Lanthanum oxyfluoride is used.

Optical coatingsDielectric materialsPrecursor for ceramic synthesisPhosphor host materials
Reference

Frequently Asked Questions

Common questions about Lanthanum oxyfluoride, answered from cross-validated data.

What is FLaO?

Lanthanum oxyfluoride is a stable, insulating compound used in advanced materials research for its unique optical and dielectric properties.

More questions
What is FLaO used for?
Lanthanum oxyfluoride (FLaO) is used in optical coatings, dielectric materials, precursor for ceramic synthesis, and phosphor host materials.
What is the band gap of FLaO?
Lanthanum oxyfluoride (FLaO) has a DFT-computed band gap of 4.22–4.75 eV across 10 reported structures. Standard DFT underestimates band gaps, so the measured gap is typically larger.
Is FLaO a metal, semiconductor, or insulator?
DFT predicts a wide band gap of up to 4.75 eV (an insulator or wide-band-gap material).
Is FLaO thermodynamically stable?
Yes — Lanthanum oxyfluoride (FLaO) sits on the convex hull (energy above hull 0 eV/atom), i.e. stable.
What is the crystal structure of FLaO?
The reference structure of Lanthanum oxyfluoride (FLaO) is tetragonal symmetry, space group P4/nmm (No. 129).
What is the density of FLaO?
The computed density of the ground-state structure of Lanthanum oxyfluoride (FLaO) is 6.00 g/cm³.
How many polymorphs of FLaO are known?
10 structures of FLaO are reported across 3 databases, spanning 5 distinct space groups.
What elements does FLaO contain?
Lanthanum oxyfluoride (FLaO) contains F, La, and O (3 elements).
Where does the data for FLaO come from?
FLaO data is cross-referenced from materials_project, cod, alexandria.
Comparison

How It Compares

As a standalone member of the lanthanum oxyhalide family, FLaO serves as a fundamental benchmark for understanding the structural and electronic behavior of rare-earth oxyfluorides. It provides a baseline for evaluating how the substitution of oxygen and fluorine influences the insulating characteristics of lanthanum-based compounds.

Data sources & attribution
  • materials_project — Data from the Materials Project (materialsproject.org). Cite: Jain et al., APL Materials 1, 011002 (2013). (CC-BY-4.0)
  • cod — Data from the Crystallography Open Database (crystallography.net/cod/). Cite: Grazulis et al., J. Appl. Cryst. 42, 726 (2009). (CC0-1.0)
  • alexandria — Data from Alexandria. Cite: Schmidt et al., npj Comput. Mater. 10, 200 (2024). (CC-BY-4.0)

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